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AComIN - Sellier Sellier, M Nedjalkov, I Dimov, S Selberherr, "Two-dimensional Transient Wigner Particle Model", Talk: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Glasgow, Scotland, United Kingdom; 2013-09-
* cited by examiner A H Gencer , D Tsamados and V Moroz , “ Fin bending due to stress and its simulation , ” 2013 International Conference on Simulation of Semiconductor Processes and Devices ( SISPAD ) , Glasgow , 2013 , pp 109-112 ( Continued ) ( 21 ) Appl No : 16 866,663 Primary Examiner Errol V Fernandes
Semiconductor Processes and Devices SISPAD2023 Jean-Charles Barbe (CEA-LETI) El Mehdi Bazizi (Applied Materials) Lado Filipovic (TU Wien) Francisco Gamiz (Univ of Granada) Vihar Georgiev (Glasgow Univ) Junichi Hattori (AIST) Sung-Min Hong (GIST) Chioko Kaneta (Tohoku Univ) Yoon-Suk Kim (Samsung Electronics) Kentaro Kukita (Kioxia) Tatsuya Kunikiyo (Renesas) Yiming Li (Nat'l Yang Ming Chiao